Introduction

Thin-Film Transistor Reliability provides a comprehensive analysis of the reliability challenges in thin-film transistors (TFTs), essential components in modern electronics. Covering topics from fundamental structures to degradation mechanisms, this book equips researchers and engineers with the tools to assess, analyze, and improve TFT reliability.

Key Features:

• - In-depth discussion of TFT degradation mechanisms and reliability concerns.
• - Comprehensive analysis techniques, including transfer curve and noise analysis.
• - Effects of DC/AC voltage stress, self-heating, and environmental factors
• - Strategies for enhancing TFT reliability through structural modifications.

Readership

Researchers, engineers, graduate students, and industry professionals in semiconductor electronics and display technology.